Line profile study from diode laser spectroscopy in the 12CH4 2v3 band perturbed by N2, O2, Ar, and He

Journal of Molecular Spectroscopy

Volumn 221, Issue 1, 2003, Pages 80-92

  Dufour, G ^a   Hurtmans, D ^b   Henry, A ^a   Valentin, A ^a   Lepere M ^c  

^a CNRS   (France)

^b UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

^c UNIVERSITY OF NAMUR   (Belgium)

Author keywords

Line broadening and narrowing; Methane; Tunable diode laser

Indexed keywords

ARGON; BAND STRUCTURE; CALCULATIONS; HELIUM; NITROGEN; OXYGEN; POTENTIAL ENERGY; PRESSURE EFFECTS; SEMICONDUCTOR LASERS; SPECTROSCOPIC ANALYSIS; SURFACES;

BROADENING; DICKE EFFECT; DIODE LASER SPECTROSCOPY; LINE PROFILE ANALYSIS;

METHANE;

EID: 0141918414     PISSN: 00222852     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-2852(03)00178-4     Document Type: Article

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