Wide-aperture, line-focused ultrasonic material characterization system based on lateral scanning

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 50, Issue 8, 2003, Pages 1046-1056

  Titov, Sergey ^a   Maev, Roman ^a   Bogatchenkov, Alexey ^b  

^a UNIVERSITY OF WINDSOR   (Canada)

^b EMANUEL INSTITUTE OF BIOCHEMICAL PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DATA ACQUISITION; ELECTROMAGNETIC WAVE PROPAGATION; ERRORS; PHASE INTERFACES; SCANNING; SPECTRUM ANALYSIS; TEMPERATURE; TRANSDUCERS; TRANSFER FUNCTIONS; TWO DIMENSIONAL;

LATERAL SCANNING; LINE FOCUSED ULTRASONIC MATERIAL CHARACTERIZATION; SPECIMEN IMMERSION LIQUID INTERFACE; TEMPERATURE COEFFICIENT;

ULTRASONICS;

EID: 0141905938     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2003.1226548     Document Type: Article

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