ESD excitation model for susceptibility study

IEEE International Symposium on Electromagnetic Compatibility

Volumn 1, Issue , 2003, Pages 58-63

  Centola, Federico ^a   Pommerenke, David ^a   Kai, Wang ^a   Van Doren, Thomas ^a   Caniggia, Spartaco ^b  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b Italtel SpA   (Italy)

Author keywords

CST Microwave studio; ESD generator; Numerical modeling

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRIC EXCITATION; ELECTROMAGNETIC FIELDS; FINITE DIFFERENCE METHOD; INTEGRATION; MAGNETIC SUSCEPTIBILITY; TIME DOMAIN ANALYSIS;

ELECTROSTATIC DISCHARGE GENERATORS; FINITE DIFFERENCE TIME DOMAIN METHOD; FINITE INTEGRATION TECHNIQUE; NUMERICAL MODELING;

ELECTROSTATIC GENERATORS;

EID: 0141905746     PISSN: 01901494     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. Kai Wang, Pommerenke, D., R. Chundru, "Numerical modeling of ESD-Simulator", 2002 IEEE International Symposium on EMC, Vol. 1, 2002. Page(s): 93-98.
2. De Ktelaere W., Martens L., Braem Y, Vlietinck Y, "Calculation of the ESD-pulse parameters and associated uncertainty for ESD-gun calibration", 2000 IEEE International Symposium on EMC, Vol. 1, 2000. Page(s): 449-452 vol.1.
3. Rizvi M., Lo Vetri J., "ESD source modeling in FDTD", Symposium Record. Compatibility in the Loop, 1994 IEEE International Symposium on EMC, 1994. Page(s) 77-82.
4. Graziano Cerri, Roberto De Leo, Roberto De Rentiis, Valter Mariani Primiani. "ESD Field Penetration Through Slots into Shielded Enclosures: A time Domain Approach" IEEE Trans. on EMC, Vol. 39, NO. 4, November 1997.
5. David J. Pommerenke, Thomas P. Van Doren, Wang Kai, 'ESD Currents and Fields on the VCP and the HCP Modeled Using Quasi-static Approximations', 2002 IEEE International Symposium on EMC, Minneapolis, Minnesota.
6. Ramachandran Chundru, David Pommerenke, Wang Kai, Tom Van Doren, Federico Centola, Juisheng Huang, 'Characterization of Human Metal ESD Reference Discharge Event and Correlation of Generator Parameters to Failure Levels', in the review process for the IEEE Trans. on EMC.
7. Microwave Studio, CST - Computer Simulation Technology-, Bad Nuheimer Str. 19, 64289 Darmstadt, Germany.