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Volumn 1, Issue , 2003, Pages 439-442

Study of tracking wheel test method under DC voltage

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ELECTRIC LINES; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; RESISTORS;

EID: 0141905001     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (10)

References (1)
  • 1
    • 0141931837 scopus 로고    scopus 로고
    • IEC 62217 Ed. 1.0, COMMITTED DRAFT, Sep.
    • IEC 62217 Ed. 1.0, COMMITTED DRAFT, Sep. 2002
    • (2002)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.