Measurement of Ion-Induced Secondary Electron Emission Coefficient for MgO Thin Film with Plasma Treatment

IEEE International Conference on Plasma Science

Volumn , Issue , 2003, Pages 226-

  Jeong, H S ^a   Oh, J S ^a   Lim, J Y ^a   Park, W B ^a   Cho, J W ^a   Choi, E H ^a  

^a Kwangwoon University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; ELECTRON EMISSION; PLASMA DISPLAY DEVICES; SINTERING; THIN FILMS;

PLASMA TREATMENT;

MAGNESIA;

EID: 0141893595     PISSN: 07309244     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)