A new microwave resonant technique for studying rare earth photoionization thresholds in dielectric crystals under laser irradiation

Optical Materials

Volumn 24, Issue 1-2, 2003, Pages 137-141

  Joubert, M F ^a   Kazanskii, S A ^a   Guyot, Y ^a   Gacon J C ^a   Rivoire, J Y ^a   Pedrini C ^a  

^a University of Lyon   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; DOPING (ADDITIVES); LASER BEAM EFFECTS; MICROWAVES; PHOTOIONIZATION; PHOTONS; RARE EARTH COMPOUNDS; THRESHOLD VOLTAGE;

MICROWAVE RESONANCE;

CRYSTALLINE MATERIALS;

EID: 0141889947     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-3467(03)00117-4     Document Type: Conference Paper

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