Estimating the Deviation from Exponentiality Under Random Censorship

Communications in Statistics - Theory and Methods

Volumn 32, Issue 11, 2003, Pages 2117-2137

  Dauxois, Jean Yves ^a  

^a CREST   (France)

Author keywords

Censored data; Gaussian process; Goodness of fit test; Kaplan Meier estimator; Mean residual life; Skorohod topology; Weak convergence

Indexed keywords

DATA PROCESSING; ESTIMATION; FUNCTIONS; RANDOM PROCESSES;

RANDOM CENSORSHIP;

STATISTICAL METHODS;

EID: 0141888932     PISSN: 03610926     EISSN: None     Source Type: Journal    
DOI: 10.1081/STA-120024471     Document Type: Article

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