Thermally stimulated current analysis of shallow levels in TlGaS 2 layered single crystals

Semiconductor Science and Technology

Volumn 18, Issue 9, 2003, Pages 834-838

  Yuksek, N S ^a   Gasanly, N M ^a   Ozkan, H ^a  

^a MIDDLE EAST TECHNICAL UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

HEATING; SEMICONDUCTOR GROWTH; THALLIUM COMPOUNDS; THERMAL EFFECTS; THERMOANALYSIS;

RETRAPPING PROCESSES;

SINGLE CRYSTALS;

EID: 0141857602     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/18/9/304     Document Type: Article

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