Systematic patterns in T2 charts

Journal of Quality Technology

Volumn 35, Issue 1, 2003, Pages 47-58

  Mason, Robert L ^a   Chou, Youn Min ^b   Sullivan, Joe H ^c   Stoumbos, Zachary G ^d   Young, John C ^e  

^a SOUTHWEST RESEARCH INSTITUTE   (United States)

^b UNIVERSITY OF TEXAS AT SAN ANTONIO   (United States)

^c MISSISSIPPI STATE UNIVERSITY   (United States)

^d RUTGERS UNIVERSITY   (United States)

^e MCNEESE STATE UNIVERSITY   (United States)

Author keywords

Autocorrelation; Multivariate statistical process control; Trends

Indexed keywords

CORRELATION METHODS; ESTIMATION; GRAPH THEORY; MATHEMATICAL MODELS; MATRIX ALGEBRA; NORMAL DISTRIBUTION; REGRESSION ANALYSIS;

COVARIANCE MATRIX ESTIMATOR; SHEWHART CONTROL CHART;

STATISTICAL PROCESS CONTROL;

EID: 0141856362     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.2003.11980190     Document Type: Article

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