Object adapted pattern projection - Part I: Generation of inverse patterns

Optics and Lasers in Engineering

Volumn 41, Issue 1, 2004, Pages 31-50

  Li, Wansong ^a,b   Bothe, Thorsten ^a   Osten, Wolfgang ^a   Kalms, Michael ^a  

^a UNIVERSITY OF BREMEN   (Germany)

^b SICHUAN UNIVERSITY   (China)

Author keywords

Absolute phase measurement; Fringe projection; Inverse projection; Optical metrology

Indexed keywords

CAMERAS; IMAGE ANALYSIS; INVERSE PROBLEMS; QUALITY CONTROL;

INVERSE PATTERNS;

PROJECTION SYSTEMS;

EID: 0141838993     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(02)00116-1     Document Type: Article

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