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Volumn 18, Issue 8, 2003, Pages 1900-1907
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Thin-film compound phase formation at Fe-Ge and Cr-Ge interfaces
a
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Author keywords
[No Author keywords available]
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Indexed keywords
CHROMIUM ALLOYS;
COMPUTER SIMULATION;
ENTHALPY;
IRON ALLOYS;
PHASE COMPOSITION;
PHASE TRANSITIONS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SPECIFIC HEAT;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
CHROMIUM GERMANIUM ALLOYS;
IRON GERMANIUM ALLOYS;
MIEDEMA MODEL;
TRANSFORMATION ENTHALPY;
INTERFACES (MATERIALS);
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EID: 0141837168
PISSN: 08842914
EISSN: None
Source Type: Journal
DOI: 10.1557/JMR.2003.0266 Document Type: Article |
Times cited : (5)
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References (16)
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