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Volumn 5040 I, Issue , 2003, Pages 69-77
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Fast and rigorous three-dimensional mask diffraction simulation using battle-lemarie wavelet based multiresolution time-domain method
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Author keywords
Lithography simulation; Multiresolution time domain method; Phase shifting masks
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Indexed keywords
ALGORITHMS;
COMPUTER SIMULATION;
FINITE DIFFERENCE METHOD;
NYQUIST DIAGRAMS;
PHOTOLITHOGRAPHY;
TIME DOMAIN ANALYSIS;
BATTLE-LEMARIE WAVELET BASED MULTIRESOLUTION TIME-DOMAIN METHOD;
NYQUIST LIMIT;
PHASE-SHIFTING MASK;
THREE-DIMENSIONAL MASK DIFFRACTION SIMULATION;
MASKS;
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EID: 0141833847
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.485433 Document Type: Conference Paper |
Times cited : (12)
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References (4)
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