Structural studies of N-2-(3-picolyl)- and N-2-(4-picolyl)-N′ -tolylthioureas

Journal of Chemical Crystallography

Volumn 32, Issue 11, 2002, Pages 431-438

  Valdés Martínez, Jesús ^a   Hernández Ortega, Simón ^a   Hermetet, Anne K ^b   Ackerman, Lily J ^b   Presto, Carmina A ^b   Swearingen, John K ^b   Kelman, Diantha R ^c   Goldberg, Karen I ^c   Kaminsky, Werner ^c   West, Douglas X ^c  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b ILLINOIS STATE UNIVERSITY   (United States)

^c UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Hydrogen bonding; Pyridine; Thiourea

Indexed keywords

N 2 (3 PICOLYL) N' 4 TOLYLTHIOUREA; N 2 (4 PICOLYL) N' 2 TOLYLTHIOUREA; N 2 (4 PICOLYL) N' 4 TOLYLTHIOUREA; PICOLINE DERIVATIVE; THIOCYANIC ACID DERIVATIVE; THIOUREA DERIVATIVE; UNCLASSIFIED DRUG;

ARTICLE; CHEMICAL REACTION; CHEMICAL STRUCTURE; CRYSTAL; HYDROGEN BOND; PROTON NUCLEAR MAGNETIC RESONANCE; QUANTUM YIELD; SOLID STATE; STRUCTURE ANALYSIS;

EID: 0141831689     PISSN: 10741542     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1021136508168     Document Type: Article

References (13)

1. Kascheres, A.; Ueno, M. J. Heterocycl. Chem. 1991, 28, 2057.
2. West, D.X.; Hermetet, A.K.; Ackerman, L.J.; Valdés-Martí nez, J.; Hernández-Ortega, S. Acta Crystallogr., Sect. C 1999, 55, 811.
3. Valdés-Martínez, J.; Hernández-Ortega, S.; West, D.X.; Ackerman, L.J.; Swearingen, J.K.; Hermetet, A.K.J. Mol. Struct. 1999, 478, 219.
4. West, D.X.; Swearingen, J.K.; Hermetet, A.K.; Ackerman, L.J.; Presto, C. J. Mol. Struct. 2000, 522, 27.
5. Sudbeck, E.A.; Jennissen, J.D.; Venkatachalam, T.K.; Uckun, F.M. Acta Crystallogr., Sect. C 1999, 55, 2122.
6. Valdés-Martínez, J.; Hernández-Ortega, S.; Espinosa-Pérez, G.; Presto, C. A.; Hermetet, A.K.; Haslow, K.D.; Ackerman, L.J.; Szczepura, L.F.; Goldberg, K.I.; Glesen, J.M.; Kaminsky, W.; West, D.X.J. Mol. Struct. 2002, 608, 77.
7. Hermetet, A.K.; Ackerman, L.J.; Swearingen, J.K.; Presto, C.; Kelman, D.R.; Giesen, J.M.; Goldberg, K.I.; Kaminsky, W.; West, D.X. J. Chem. Cryst. 2002, 32, 17.
8. International Tables for X-ray Crystallography; Kluwer Academic Publishers: Dordrecht, The Netherlands, 1995; Vol. C.
9. Siemens. SHELXTL PC™, Release 4.1 for Siemens Crystallographic Research System; Siemens Analytical X-ray Instruments, Inc.: Madison, WI, 1990.
10. Wassmaier, D.; Kirfel, A. Acta Crystallogr., Sect. A 1995, 51, 416.
11. Mackay, S.; Edwards, C.; Henderson, A.; Gilmore, C.; Stewart, N.; Shankland, K.; Donald, A; Mackay, S.; Edwards, C.; M. Tremayne, M.; Stewart, N. ; Shankland, K.; Gilmore, C. MaXus, A Computer Program for the Solution and Refinement of Crystal Structures and Diffraction Data; University of Glasgow: Scotland, UK (Nonius BV, Delft, the Netherlands, MacScience Co. Ltd., Yokohama, Japan), 1998.
12. Etter, M.C.J. Phys. Chem. 1991, 95, 4601.
13. McBride; M.T., Luo, T.-J. M.; Palmore, G.T.R. Crysto. Grow Des. 2001, 1, 39.