메뉴 건너뛰기




Volumn 15, Issue 34, 2003, Pages 5793-5799

The effect of thermal annealing on crystallization in a-Si:H/SiO 2 multilayers by using layer by layer plasma oxidation

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; GRAIN SIZE AND SHAPE; OXIDATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RAPID THERMAL ANNEALING;

EID: 0141830854     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/34/309     Document Type: Conference Paper
Times cited : (40)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.