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Volumn 4964, Issue , 2003, Pages 59-65
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Quantitative Phase Measurements Using a Quadrature Tomographic Microscope
a,c b b b a a a,c |
Author keywords
[No Author keywords available]
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Indexed keywords
DIFFRACTION GRATINGS;
IMAGING TECHNIQUES;
MICROSCOPES;
TOMOGRAPHY;
QUADRATURE TOMOGRAPHIC MICROSCOPES;
PHASE MEASUREMENT;
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EID: 0141828497
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.478343 Document Type: Conference Paper |
Times cited : (9)
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References (6)
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