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Volumn 629, Issue 10, 2003, Pages 1688-1700

Kinetics of oxidation processes in the system Co/Ga studied by in situ X-ray diffraction

Author keywords

Cobalt; Gallium; In situ X ray diffraction; Intermetallic compounds; Oxidation

Indexed keywords

ALLOY; COBALT DERIVATIVE; GALLIUM; METAL OXIDE; OXIDE;

EID: 0141818054     PISSN: 00442313     EISSN: None     Source Type: Journal    
DOI: 10.1002/zaac.200300141     Document Type: Article
Times cited : (6)

References (23)
  • 4
    • 24544438747 scopus 로고    scopus 로고
    • Thesis, Univ. Giessen
    • D. Schönfeld, Thesis, Univ. Giessen, 1996.
    • (1996)
    • Schönfeld, D.1
  • 5
    • 0141600652 scopus 로고    scopus 로고
    • U.S. Patent Number 3 330 697, 1967
    • P. Pechini, U.S. Patent Number 3 330 697, 1967.
    • Pechini, P.1
  • 11
    • 0141489099 scopus 로고    scopus 로고
    • note
    • Experiments were performed by Dr. O. Teller in the laboratory of Prof. H.-I. Yoo, Seoul National University, Korea.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.