Reduced-temperature crystallization of thin amorphous Fe80B20 films studied via empirical modeling of extended x-ray absorption fine structure

Applied Physics Letters

Volumn 68, Issue 15, 1996, Pages 2073-2075

  Harris, V G ^a   Oliver, S A ^b   Ayers, J D ^a   Das, B N ^a   Koon, N C ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

^b NORTHEASTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0141808651     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116307     Document Type: Article

References (12)

1. See for example: R. S. Swineford, D. P. Pappas, and V. G. Harris, Phys. Rev. B 52, 7890 (1995).
2. V. G. Harris, B. N. Das, W. T. Elam, and N. C. Koon, Mater. Res. Soc. Symp. Proc. 321, 185 (1994).
3. See, for example, F. E. Luborsky and H. H. Liebermann, Appl. Phys. Lett. 33, 233 (1978); H. Franke, U. Herold, U. Koster, and M. Rosenberg, Proceedings of the Third International Conference on Rapidly Quenched Metals (Metals Society, London, 1978), Vol. 1; F. H. Sanchez, Y. D. Zhang, and J. I. Budnick, Phys. Rev. B 38, 8508 (1988); T. Kemeny, I. Vincze, A. S. Schaafsma, van der Woude, and A. Lovas, Nucl. Instrum. Methods 199, 153 (1982); M. Takahashi, M. Koshimura, and T. Abuzuka, Jap. J. Appl. Phys. 20, 1821 (1981).
4. J. Wong, F. W. Lytle, J. L. Walter, and F. E. Luborsky, Bull. Am. Phys. Soc. 23, 467 (1978).
5. J. Wong, F. W. Lytle, R. B. Greegor, H. H. Liebermann, J. L. Walter, and F. E. Luborsky, Proceedings of the Third International Conference on Rapidly Quenched Metals (Metals Society, London, 1978), Vol. II, p. 345.
6. 20 was used as the target. The film was deposited at 10-4 Torr (base pressure= 10-8 Torr), and attained a maximum temperature during deposition of 330 K.
7. W. T. Elam, J. P. Kirkland, R. A. Neiser, and P. D. Wolf, Phys. Rev. B 38, 26 (1988).
8. R. A. Neiser, J. P. Kirkland, W. T. Elam, and S. Sampath, Nucl. Instrum. Methods A 266, 220 (1988).
9. Y. Khan, E. Kneller, and M. Sostarich, Z. Metallkd. 73, 624 (1982).
10. M. Matsuura, Solid State Commun. 30, 231 (1979).
11. J. D. Ayers, J. H. Konnert, P. D'Antonio, A. Pattnail, C. L. Vold, and H. N. Jones, J. Mater. Sci. 30, 4492 (1995).
12. The parameters for the amorphous component must be varied during fitting because the chemistry of this phase changes with the progressive crystallization of the sample.