Ordering and quality factor in 0.95BaZn1/3Ta2/3 O3-0.05SrGa1/2Ta1/2O3 production resonators

Journal of the European Ceramic Society

Volumn 23, Issue 16, 2003, Pages 3021-3034

  Reaney, I M ^a   Wise, P L ^a   Qazi, I ^a   Miller, C A ^a   Price, T J ^b   Cannell, D S ^b   Iddles, D M ^b   Rosseinsky, M J ^c   Moussa, S M ^c   Bieringer, M ^c   Noailles, L D ^c   Ibberson, R M ^d  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

^b Filtronic Comtek   (United Kingdom)

^c UNIVERSITY OF LIVERPOOL   (United Kingdom)

^d RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

Ba(Zn,Ta)O3; Electron microscopy; Microwave dielectric properties; Neutron diffraction; Perovskites; Sr(Ga,Ta)O3; X ray diffraction

Indexed keywords

ANNEALING; ELECTRON DIFFRACTION; MOBILE TELECOMMUNICATION SYSTEMS; NEUTRON DIFFRACTION; PEROVSKITE; RESONATORS; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

PRODUCTION RESONATORS;

CERAMIC MATERIALS;

CERAMICS;

EID: 0141795511     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00117-1     Document Type: Article

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