Swept-wavelength interferometric analysis of multiport components

IEEE Photonics Technology Letters

Volumn 15, Issue 9, 2003, Pages 1267-1269

  VanWiggeren, Gregory D ^a   Baney, Douglas M ^a  

^a AGILENT LABORATORIES   (United States)

Author keywords

Optical devices; Optical interferometry; Optical variables measurement; Reflectometry

Indexed keywords

DIFFRACTION GRATINGS; LIGHT INTERFERENCE; LIGHT POLARIZATION; OPTICAL DEVICES; OPTICAL SWITCHES; OPTICAL VARIABLES MEASUREMENT;

DEVICE-UNDER-TEST; GROUP DELAY; LOCAL OSCILLATOR; MULTIPORT COMPONENTS; POLARIZATION DELAY UNIT; SWEPT-WAVELENGTH INTERFEROMETRIC ANALYSIS;

INTERFEROMETRY;

EID: 0141786787     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2003.816663     Document Type: Article

References (6)

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