A new reliable method for delay-fault diagnosis

Proceedings of the IEEE International Conference on VLSI Design

Volumn , Issue , 1992, Pages 12-16

  Flottes, M L ^a   Girard, P ^a   Landrault, C ^a   Pravossoudovitch, S ^a  

^a LIRMM   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DELAY CIRCUITS; FAILURE ANALYSIS; VLSI CIRCUITS;

DELAY FAULTS; FAULT-FREE CIRCUITS; RELIABLE METHODS; SYMBOLIC SIMULATION; TIMING FAILURES;

FAULT DETECTION;

EID: 0141779643     PISSN: 10639667     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICVD.1992.658014     Document Type: Conference Paper

References (16)

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