X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) study of the tarnishing of metal-coated textiles

Journal of the Textile Institute

Volumn 90, Issue 3, 1999, Pages 50-59

  Howell, D ^a   Mitchell, R ^b   Carr, C M ^c   Walton, J ^c  

^a Textile Conservation Studios   (United Kingdom)

^b CSMA Ltd   (United Kingdom)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0141768198     PISSN: 00405000     EISSN: 17542340     Source Type: Journal    
DOI: 10.1080/00405009908659478     Document Type: Article

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