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Volumn 68, Issue 1, 2003, Pages

Improved tight-binding parametrization for the simulation of stacking faults in aluminum

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM;

EID: 0141763884     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.012105     Document Type: Article
Times cited : (3)

References (21)
  • 9
    • 85038953273 scopus 로고    scopus 로고
    • I. Takeuchi, H. Koinuma, E. J. Amis, J. M. Newsam, and L. T. WilleMRS Symposia Proceedings, Materials Research Society, Pittsburgh
    • A.G. Frøseth, P. Derlet, and R. Høier, in Combinatorial and Artificial Intelligence Methods in Materials Science, edited by I. Takeuchi, H. Koinuma, E. J. Amis, J. M. Newsam, and L. T. Wille, MRS Symposia Proceedings No. 700 Materials Research Society, Pittsburgh, 2001.
    • (2001) Combinatorial and Artificial Intelligence Methods in Materials Science , vol.700
    • Frøseth, A.G.1    Derlet, P.2    Høier, R.3
  • 18
    • 0001100863 scopus 로고
    • R. W. Siegel, J. R. Weertman, and R. Sinclair, MRS Symposia Proceedings, Materials Research Society, Pittsburgh
    • A.F. Voter and S.P. Chen, in Characterization of Defects in Material, edited by R. W. Siegel, J. R. Weertman, and R. Sinclair, MRS Symposia Proceedings No. 82 (Materials Research Society, Pittsburgh, 1987).
    • (1987) Characterization of Defects in Material , vol.82
    • Voter, A.F.1    Chen, S.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.