All-optical extended depth of field imaging system

Journal of Optics A: Pure and Applied Optics

Volumn 5, Issue 5, 2003, Pages

  Ben Eliezer, Eyal ^a   Zalevsky, Zeev ^a   Marom, Emanuel ^a   Konforti, Naim ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

Extended depth of field; Imaging systems; MTF; OTF

Indexed keywords

CHARGE COUPLED DEVICES; COMPUTER SIMULATION; OPTICAL INSTRUMENT LENSES; OPTICAL RESOLVING POWER;

PHASE MASK;

IMAGING SYSTEMS;

EID: 0141757393     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/5/5/359     Document Type: Conference Paper

References (19)

1. Goodman J W 1996 Introduction to Fourier Optics (New York: McGraw-Hill) pp 126-51
2. Light G and Groen F 1982 Proc. IEEE Int. Conf. on Pattern Recognition (Piscataway, NJ: IEEE) p 597
3. Pentland A P 1987 IEEE Trans. Pattern Anal. Mach. Intell. 9 523
4. Krotkov E 1987 Int. J. Comput. Vis. 1 223
5. Subbarao M, Choi T and Nikzad A 1993 Opt. Eng. 32 2824
6. Lohmann A W, Mendlovic D and Zalevsky Z 1997 Appl. Opt. 36 7204
7. Raveh I, Mendlovic D, Zalevsky Z and Lohmann A W 1999 Opt. Eng. 38 1620
8. Mino M and Okano Y 1971 Appl. Opt. 10 2219
9. Ojeda-Castaneda J, Ramos R and Noyola-Isgleas A 1988 Appl. Opt. 27 2583
10. Ojeda-Castaneda J, Tepichin T and Diaz A 1989 Appl. Opt 28 2666
11. Ojeda-Castaneda J and Berriel-Valdos L R 1990 Appl. Opt. 29 994
12. Dowski E R Jr and Cathey W T 1995 Appl. Opt. 34 1859
13. Van der Gracht J, Dowski E R, Taylor M G and Deaver D M 1996 Opt. Lett. 21 919
14. Bradburn S, Cathey W T and Dowski E R 1997 Appl. Opt. 36 9157
15. Van der Gracht J, Dowski E R, Cathey W T and Bowen J P 1995 Proc. SPIE 2537 279
16. Chi W and George N 2001 Opt. Lett. 26 875
17. Ben-Eliezer E, Zalevsky Z, Marom E and Konforti N 2002 Proc. SPIE 4829 221
18. Hopkins H H 1966 Opt. Acta 13 343
19. Bartelt H O, Ojeda-Castaneda J and Sicre E E 1984 Appl. Opt. 23 2693