Direct measurement of 248- and 193-nm excimer-induced densification in silica-germania waveguide blanks: Comment

Journal of the Optical Society of America B: Optical Physics

Volumn 19, Issue 9, 2002, Pages 2039-2041

  Poumellec, Bertrand ^a   Niay, Pierre ^b  

^a UNIVERSITÉ PARIS SUD   (France)

^b UNIV LILLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DENSIFICATION; EXCIMER LASERS; FINITE ELEMENT METHOD; REFRACTIVE INDEX; ULTRAVIOLET RADIATION;

INELASTIC STRAINS;

OPTICAL WAVEGUIDES;

EID: 0141748457     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.19.002039     Document Type: Review

References (10)

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