Raman and x-ray diffraction studies of nanometric Sn2P2S6 crystals

Journal of Physics Condensed Matter

Volumn 15, Issue 37, 2003, Pages 6381-6393

  Gomonnai, A V ^a   Azhniuk, Yu M ^a   Vysochanskii, Yu M ^b   Kikineshi, A A ^b   Kis Varga, M ^c   Daroczy, L ^d   Prits, I P ^b   Voynarovych, I M ^b  

^a INSTITUTE OF ELECTRON PHYSICS   (Ukraine)

^b UZHGOROD NATIONAL UNIVERSITY   (Ukraine)

^c INSTITUTE OF EXPERIMENTAL MEDICINE   (Hungary)

^d UNIVERSITY OF DEBRECEN   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; OXYGEN; RAMAN SPECTROSCOPY; RELAXATION PROCESSES; SULFUR; TIN COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

CONFINEMENT RELATED SELECTION RULES RELAXATION; CRYSTALLITE SIZE; PARTIAL SUBSTITUTION; SURFACE PHONON MODES;

NANOSTRUCTURED MATERIALS;

EID: 0141732173     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/37/006     Document Type: Article

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