Direct and inverse problems for light scattered by rough surfaces

Applied Optics

Volumn 29, Issue 25, 1990, Pages 3613-3626

  Marx, Egon ^a   Vorburger, T V ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Autocorrelation length; Electromagnetic scattering; Least squares fit; Random rough surface; Scattero metry; Surface roughness

Indexed keywords

EID: 0141725321     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.29.003613     Document Type: Article

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