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Volumn 5037 I, Issue , 2003, Pages 75-82

Development of illumination optics and projection optics for high-NA EUV exposure tool (HiNA)

Author keywords

Aspheric mirrors; Fly's eye element; Illumination optics; Projection optics; Wavefront error

Indexed keywords

COHERENT LIGHT; DEGREES OF FREEDOM (MECHANICS); DIFFRACTIVE OPTICS; ERRORS; IMAGE QUALITY; INTERFEROMETERS; MIRRORS; NUMERICAL METHODS; OPTICAL MATERIALS; ULTRAVIOLET RADIATION;

EID: 0141682760     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.484936     Document Type: Conference Paper
Times cited : (21)

References (7)
  • 1
    • 0003797312 scopus 로고    scopus 로고
    • Extreme ultraviolet lithography, a white paper
    • EUV LLC
    • C. Gwyn, et al., "Extreme Ultraviolet Lithography, A White Paper", EUV LLC (1999).
    • (1999)
    • Gwyn, C.1
  • 4
    • 0033698635 scopus 로고    scopus 로고
    • Novel illumination system for EUVL
    • H. Komatsuda, "Novel illumination system for EUVL" Proc. SPIE 3997, 765 (2000).
    • (2000) Proc. SPIE , vol.3997 , pp. 765
    • Komatsuda, H.1
  • 5
    • 0036381633 scopus 로고    scopus 로고
    • Effect of argon and non-argon ion impingement on stress reduction of multilayers for extreme ultraviolet lithography
    • M. Shiraishi, W. Ishiyama, N. Kandaka, T. Oshino and K. Murakami, "Effect of argon and non-argon ion impingement on stress reduction of multilayers for extreme ultraviolet lithography" Proc. SPIE 4688, 516 (2002).
    • (2002) Proc. SPIE , vol.4688 , pp. 516
    • Shiraishi, M.1    Ishiyama, W.2    Kandaka, N.3    Oshino, T.4    Murakami, K.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.