SCOPUS 정보 검색 플랫폼

Crystal Research and Technology

Volumn 38, Issue 9, 2003, Pages 760-766

Influence of simultaneous doping of Tl and Bi on microstructure and critical current density oef HgBa2Ca2Cu3O8+δ

(4) Giri, Rajiv a Verma, G D b Tiwari, R S a Srivastava, O N a

a BANARAS HINDU UNIVERSITY (India)

b INDIAN INSTITUTE OF TECHNOLOGY ROORKEE (India)

Author keywords

Defect substructure; Intagrain critical current density (Jc); Long period polytypoid (LPP)

Indexed keywords

COMPOSITION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL DEFECTS; CRYSTAL MICROSTRUCTURE; DOPING (ADDITIVES); SYNTHESIS (CHEMICAL); THERMAL EFFECTS;

DEFECT SUBSTRUCTURE; INTRAGRAIN CRITICAL CURRENT DENSITY; LONG PERIOD POLYTYPOID;

HIGH TEMPERATURE SUPERCONDUCTORS;

EID: 0141680868 PISSN: 02321300 EISSN: None Source Type: Journal
DOI: 10.1002/crat.200310092 Document Type: Article

Times cited : (8)

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