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Volumn 93, Issue 1, 2002, Pages 132-135

On Measurements of the Refractive Index Dispersion in Porous Silicon

Author keywords

[No Author keywords available]

Indexed keywords

FABRY-PEROT INTERFEROMETERS; REFRACTIVE INDEX; SPECTROGRAPHS; THIN FILMS;

EID: 0141671767     PISSN: 0030400X     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1496736     Document Type: Article
Times cited : (6)

References (19)
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    • (1977) Sov. Phys. JETP , vol.45 , pp. 1084
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    • L. E. Solov'ev and M. O. Chaǐka, Opt. Spektrosk. 49, 733 (1980) [Opt. Spectrosc; 49, 400 (1980)].
    • (1980) Opt. Spectrosc. , vol.49 , pp. 400
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    • L. E. Solov'ev and M. O. Chaǐka, Opt. Spektrosk. 58, 373 (1985) [Opt. Spectrosc. 58, 223 (1985)].
    • (1985) Opt. Spectrosc. , vol.58 , pp. 223
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    • S. A. Boǐko and S. F. Terekhova, Opt. Spektrosk. 49, 1151 (1980) [Opt. Spectrosc. 49, 630 (1980)].
    • (1980) Opt. Spectrosc. , vol.49 , pp. 630
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    • 0040081410 scopus 로고    scopus 로고
    • L. V. Belyakov, T. L. Makarova, V. I. Sakharov, et al., Fiz. Tekh. Poluprovodn. (St. Petersburg) 32, 1122 (1998) [Semiconductors 32, 1003 (1998)].
    • (1998) Semiconductors , vol.32 , pp. 1003
  • 19
    • 0041020278 scopus 로고    scopus 로고
    • M. I. Strashnikova, V. L. Voznyǐ, V. Ya. Reznichenko, and V. Ya. Gaǐvoronskiǐ, Zh. Éksp. Teor. Fiz. 120, 409 (2001) [JETP 93, 363 (2001)].
    • (2001) JETP , vol.93 , pp. 363


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.