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Volumn 93, Issue 1, 2002, Pages 132-135
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On Measurements of the Refractive Index Dispersion in Porous Silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
FABRY-PEROT INTERFEROMETERS;
REFRACTIVE INDEX;
SPECTROGRAPHS;
THIN FILMS;
PHASE VELOCITY;
POROUS SILICON;
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EID: 0141671767
PISSN: 0030400X
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1496736 Document Type: Article |
Times cited : (6)
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References (19)
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