Use of VFSA for resolution, sensitivity and uncertainty analysis in 1D DC resistivity and IP inversion

Geophysical Prospecting

Volumn 51, Issue 5, 2003, Pages 393-408

  Bhattacharya, Bimalendu B ^a   Shalivahan, ^a   Sen, Mrinal K ^b  

^a INDIAN SCHOOL OF MINES   (India)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GLOBAL OPTIMIZATION; PROBABILITY DENSITY FUNCTION; SENSITIVITY ANALYSIS; SIMULATED ANNEALING;

NON-LINEAR INVERSION;

GEOPHYSICAL PROSPECTING;

DATA INVERSION; ELECTRICAL RESISTIVITY; INDUCED POLARIZATION; SIMULATED ANNEALING; UNCERTAINTY ANALYSIS;

EID: 0141670240     PISSN: 00168025     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2478.2003.00379.x     Document Type: Article

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