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Volumn , Issue , 2002, Pages 22-28

Worst Case Clock Skew Under Power Supply Variations

Author keywords

Clock network; Clock skew; Power supply noise

Indexed keywords

ALGORITHMS; ELECTRIC POTENTIAL; INDUCTANCE; RELIABILITY; SPURIOUS SIGNAL NOISE;

EID: 0141649465     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/589412.589416     Document Type: Conference Paper
Times cited : (14)

References (12)
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    • Abhijit Dharchoudhury, et.al. "Design and analysis of power distribution networks in PowerPC microprocessors", DAC 1998, June 1998, pp. 738-743.
    • (1998) DAC 1998 , pp. 738-743
    • Dharchoudhury, A.1
  • 2
    • 0031619177 scopus 로고    scopus 로고
    • Full-Chip Verification Methods for DSM Power Distribution Systems
    • June
    • Gregory Steele, et.al., "Full-Chip Verification Methods for DSM Power Distribution Systems", DAC 1998, June 1998, pp. 744-749.
    • (1998) DAC 1998 , pp. 744-749
    • Steele, G.1
  • 4
    • 0033349678 scopus 로고    scopus 로고
    • Timing Analysis Including Clock Skew
    • Nov
    • D.Harris, M.Horowitz, D.Liu, "Timing Analysis Including Clock Skew", IEEE Transactions on CAD, Vol.18, No. 11, Nov l999, pp.1608-1618
    • (1999) IEEE Transactions on CAD , vol.18 , Issue.11 , pp. 1608-1618
    • Harris, D.1    Horowitz, M.2    Liu, D.3
  • 5
    • 0036045515 scopus 로고    scopus 로고
    • Coping with Buffer Delay Change Due to Power and Ground Noise
    • June
    • L.H. Chen, et.al., "Coping with Buffer Delay Change Due to Power and Ground Noise", DAC 2002, June 2002, pp. 860-865.
    • (2002) DAC 2002 , pp. 860-865
    • Chen, L.H.1
  • 6
    • 0034846652 scopus 로고    scopus 로고
    • Static Timing Analysis Including Power Supply Noise Effect on Propagation delay in VLSI Circuits
    • June
    • G. Bai, et.al., "Static Timing Analysis Including Power Supply Noise Effect on Propagation delay in VLSI Circuits", DAC 2001, June 2001, pp. 295-300.
    • (2001) DAC 2001 , pp. 295-300
    • Bai, G.1
  • 7
    • 0032657615 scopus 로고    scopus 로고
    • Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices
    • June
    • Y.i-Min Jiang, et.al., "Analysis of Performance Impact Caused by Power Supply Noise in Deep Submicron Devices", DAC 1999, June 1999, pp. 760-765.
    • (1999) DAC 1999 , pp. 760-765
    • Jiang, Y.-M.1
  • 8
    • 0035273397 scopus 로고    scopus 로고
    • Pattern Generation for Delay Testing and Dynamic Timing Analysis Considering Power Supply Noise Effects
    • March
    • Y.-M. Jiang, et.al., "Pattern Generation for Delay Testing and Dynamic Timing Analysis Considering Power Supply Noise Effects", IEEE Transactions on CAD, Vol. 20, No. 3, March 2001, pp. 416-425.
    • (2001) IEEE Transactions on CAD , vol.20 , Issue.3 , pp. 416-425
    • Jiang, Y.-M.1
  • 9
    • 0033689265 scopus 로고    scopus 로고
    • Clock Skew Verification in the Presence of IR-Drop in the Power Distribution Network
    • June
    • R. Saleh, et.al.,"Clock Skew Verification in the Presence of IR-Drop in the Power Distribution Network", IEEE Transactions on CAD, Vol. 19, No. 6, June 2000, pp. 635-644.
    • (2000) IEEE Transactions on CAD , vol.19 , Issue.6 , pp. 635-644
    • Saleh, R.1
  • 10
    • 0033670992 scopus 로고    scopus 로고
    • Model and analysis for combined package and on-chip power grid simulation
    • August
    • Rajendran Panda, et.al., "Model and analysis for combined package and on-chip power grid simulation", ISLPED 2000, August 2000, pp. 179-184.
    • (2000) ISLPED 2000 , pp. 179-184
    • Panda, R.1
  • 12
    • 0033685281 scopus 로고    scopus 로고
    • On Chip Inductance Modeling and Analysis
    • June
    • Kaushik Gala, et.al., "On Chip Inductance Modeling and Analysis", DAC 2000, June 2000, pp. 63 - 68.
    • (2000) DAC 2000 , pp. 63-68
    • Gala, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.