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Volumn , Issue 540, 2003, Pages 351-357
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The SIRENE facility - An improved method for simulating the charge of dielectrics in a charging electron environment
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
DIFFUSION;
ELECTRIC CHARGE;
ELECTRON BEAMS;
RADIATION;
SPECTRUM ANALYSIS;
SURFACE POTENTIALS;
DIELECTRIC MATERIALS;
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EID: 0141648541
PISSN: 03796566
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (28)
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References (8)
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