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Volumn 41, Issue 1, 2004, Pages 73-80

A compact ESPI system for displacement measurements of specular reflecting or optical rough surfaces

Author keywords

Contouring; Diffuse illumination; ESPI; Eye deformation; MEMS displacements measurements; Speckle interferometry; Specular surface; Vibration

Indexed keywords

INTERFEROMETERS; LASER BEAMS; LIGHT SCATTERING; LIGHTING; SPECKLE; SURFACE ROUGHNESS;

EID: 0141615800     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(02)00135-5     Document Type: Article
Times cited : (22)

References (10)
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    • Quasi-equal-path electronic speckle pattern interferometric system
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    • Peng, S.1    Joenathan, C.2    Khorana, B.M.3
  • 7
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  • 8
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    • Deformation measurements of specularly reflecting objects using holographic interferometry with diffuse illumination
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    • Hansen RS, Hassing S. Deformation measurements of specularly reflecting objects using holographic interferometry with diffuse illumination. In: Toshio Honda, editor, International Conference on Applications of Optical Holography. Proc. SPIE 1995; 2577: 218-25.
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    • Hansen, R.S.1    Hassing, S.2
  • 9
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    • Simple and compact ESPI system for displacement measurements on specular reflecting or optical rough surfaces
    • Chernivtsy, May 10-13
    • René Skov Hansen, Simple and compact ESPI system for displacement measurements on specular reflecting or optical rough surfaces. SPIE Fifth International Conference on Correlation Optics, Chernivtsy, May 10-13, 2001.
    • (2001) SPIE Fifth International Conference on Correlation Optics
    • Hansen, R.S.1
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    • Deformation measurement of specularly reflecting objects using holographic interferometry with diffuse illumination
    • Hansen R.S. Deformation measurement of specularly reflecting objects using holographic interferometry with diffuse illumination. Opt Lasers Eng. 28(4):1997;259-275.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.