Optical properties of CdTe nanoparticle thin films studied by spectroscopic ellipsometry

Journal of Physics D: Applied Physics

Volumn 36, Issue 17, 2003, Pages 2121-2129

  Chandra, Sharat ^a   Sundari, S Tripura ^a   Raghavan, G ^a   Tyagi, A K ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELLIPSOMETRY; EVAPORATION; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; PARTICLE SIZE ANALYSIS; PHASE TRANSITIONS; PRESSURE EFFECTS; SPECTROSCOPIC ANALYSIS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ANTI-BONDING ORBITALS; BONDING ORBITALS; DIELECTRIC SPECTRA; SPECTROSCOPIC ELLIPSOMETRY;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0141607626     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/17/315     Document Type: Article

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