Application of STS markers for leaf rust resistance genes in near-isogenic lines of spring wheat cv. Thatcher

Journal of Applied Genetics

Volumn 44, Issue 3, 2003, Pages 323-338

  Chełkowski, Jerzy ^a   Golka, Lidia ^a   Stȩpień, Łukasz ^a  

^a INSTITUTE OF PLANT GENETICS   (Poland)

Author keywords

Leaf rust; Lr genes; Molecular markers; Thatcher lines; Wheat

Indexed keywords

MOLECULAR MARKER;

ALLELISM; ARTICLE; GENE AMPLIFICATION; GENE SEQUENCE; GENE TARGETING; GENETIC LINKAGE; GENETIC RESISTANCE; HETEROZYGOTE; MARKER GENE; NONHUMAN; PLANT LEAF; POLYMERASE CHAIN REACTION; PROMOTER REGION; SEQUENCE ANALYSIS; SEQUENCE TAGGED SITE; SPRING WHEAT;

BASE SEQUENCE; FUNGI; MOLECULAR SEQUENCE DATA; POLYMERASE CHAIN REACTION; SEQUENCE TAGGED SITES; TRITICUM;

PUCCINIA; PUCCINIA RECONDITA F. SP. TRITICI; TRITICUM AESTIVUM;

EID: 0141576646     PISSN: 12341983     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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