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Volumn 52, Issue 1, 1996, Pages 127-129

3-cyano-6-(3-methoxyphenyl)-4-methylthio-2-pyranone

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0141567254     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S010827019500967X     Document Type: Article
Times cited : (5)

References (11)
  • 6
    • 84875254488 scopus 로고
    • Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
    • Sheldrick, G. M. (1990). SHELXTL-Plus. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • (1990) SHELXTL-Plus
    • Sheldrick, G.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.