XRDA3.1 - A program for X-ray diffraction analysis on a PC

Journal of Applied Crystallography

Volumn 31, Issue 1, 1998, Pages 109-110

  Desgreniers, Serge ^a   Lagarec, Ken ^a  

^a UNIVERSITY OF OTTAWA   (Canada)

Author keywords

Angle dispersive x ray diffraction; Diffraction intensity calculation; Energy dispersive x ray diffraction; Peak profile fitting; Structural parameter fitting

Indexed keywords

EID: 0141563074     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897007322     Document Type: Article

References (1)

1. Desgreniers, S. & Lagarec, K. (1994). J. Appl. Cryst. 27, 432.