How to measure relative intensity noise in lasers

Laser Focus World

Volumn 35, Issue 5, 1999, Pages 273-277

  Obarski, Gregory E ^a   Hale, Paul D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0141525540     PISSN: 10438092     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (7)

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3. G. P. Agrawal and N. K. Dutta, Semiconductor Lasers, Van Nostrand Reinhold, New York (1993), p. 258.
4. S. Machida and Y. Yamamoto, IEEE J. Quantum Electron. QE-22(5), 617 (May 1986).
5. M. C. Teich and B. E. A. Saleh, Opt. Lett. 7(8), 365 (August 1982).
6. J. A. Valdmanis and J. V. Rudd; Laser Focus World 31(3), 141 (March 1995).
7. D. M. Baney, W. V. Sorin, and S. A. Newton, IEEE Photon. Technol. Lett. 6(10), 1258 (Oct. 1994).