Improved Technologies for Marking of Different Materials

Laser Physics

Volumn 13, Issue 8, 2003, Pages 1108-1111

  Chitu, L ^a   Cernat, R ^a   Bucatica, I ^a   Puiu, A ^a   Dumitras, D C ^a  

^a NATIONAL INSTITUTE FOR LASER   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUOUS WAVE LASERS; HEAT AFFECTED ZONE; IMAGE ANALYSIS; INDUSTRIAL APPLICATIONS; LASER BEAM EFFECTS; QUALITY CONTROL; SCANNING; SOFTWARE ENGINEERING;

LASER MARKING;

CARBON DIOXIDE LASERS;

EID: 0141500256     PISSN: 1054660X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

References (8)

1. Régis Larue de Tournemine, 1989, Proc. SPIE, 1132, 181.
2. Gasser, A., Kreutz, E.W., and Wissenbach, K., 1989, Proc. SPIE, 1132, 260.
3. Kaplan, A.F.H., 1998, Marking and Scribing, in Handbook of the EuroLaser Academy, Schnocker, D., Ed. (New York: Chapman and Hall), vol. 2, p. 445.
4. Dumitras, D.C., 1999, Biophotonics. Fundamentals of Laser Applications in Medicine and Biology (Bucharest: All Educational Publishing House) (in Romanian).
5. Dumitras, D.C., Dutu, D.C., Comaniciu, N., and Draganescu, V., 1976, Rev. Roum. Phys., 21, 559.
6. 1985, Laser Beam Scanning: Opto-Mechanical Devices, Systems and Data Storage Optics, Marshall, G.F., Ed. (New York: Marcel Dekker).
7. SCANLAB AG, Benzstrasse 28, D-82178 Puchheim, Germany.
8. Domankevitz, Y., Bua, D., Chung, J., Hanel, E., Silver, G., and Nishioka, N.S., 1994, Proc. SPIE, 2134A, 288.