SCOPUS 정보 검색 플랫폼

Journal of Magnetism and Magnetic Materials

Volumn 261, Issue 1-2, 2003, Pages 1-

Local exchange bias observed by photoemission microscopy

(5) Offi, F a,b Kuch, W a Chelaru, L I a Kotsugi, M a Kirschner, J a

a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

b INFM (Italy)

Author keywords

Antiferromagnetic films; Exchange bias; Magnetic domains; Photoemission microscopy; Ultrathin magnetic films

Indexed keywords

ANTIFERROELECTRIC MATERIALS; COBALT; ELECTRON MICROSCOPES; FERROMAGNETIC MATERIALS; MAGNETIC THIN FILMS; MAGNETIZATION; PHOTOEMISSION; SINGLE CRYSTALS; ULTRATHIN FILMS; X RAY ANALYSIS;

LOCAL EXCHANGE;

MAGNETISM;

EID: 0141496000 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-8853(02)01481-6 Document Type: Article

Times cited : (13)

References (14)

1
- 36149020938
- Meiklejohn W.H., Bean C.P. Phys. Rev. 102:1956;1413.
- (1956) Phys. Rev. , vol.102 , pp. 1413
- Meiklejohn, W.H.¹ Bean, C.P.²

2
- 30244560850
- Dieny B., Speriosu V.S., Parkin S.S.P., Gurney B.A., Wilhoit D.R., Mauri D. Phys. Rev. B. 43:1991;1297.
- (1991) Phys. Rev. B , vol.43 , pp. 1297
- Dieny, B.¹ Speriosu, V.S.² Parkin, S.S.P.³ Gurney, B.A.⁴ Wilhoit, D.R.⁵ Mauri, D.⁶

3
- 0030195567
- Kools J.C.S. IEEE Trans. Magn. 32:1996;3165.
- (1996) IEEE Trans. Magn. , vol.32 , pp. 3165
- Kools, J.C.S.¹

4
- 0033514208
- Nogués J., Schuller I.K. J. Magn. Magn. Mater. 192:1999;203.
- (1999) J. Magn. Magn. Mater. , vol.192 , pp. 203
- Nogués, J.¹ Schuller, I.K.²

5
- 0034511522
- Stamps R.L. J. Phys. D. 33:2000;R247.
- (2000) J. Phys. D , vol.33
- Stamps, R.L.¹

6
- 0037479931
- Miltényi P., Gierlings M., Bamming M., May U., Güntherodt G., Nogués J., Gruyters M., Leighton C., Schuller I.K. Appl. Phys. Lett. 75:1999;2304.
- (1999) Appl. Phys. Lett. , vol.75 , pp. 2304
- Miltényi, P.¹ Gierlings, M.² Bamming, M.³ May, U.⁴ Güntherodt, G.⁵ Nogués, J.⁶ Gruyters, M.⁷ Leighton, C.⁸ Schuller, I.K.⁹

7
- 4243377084
- Nogués J., Lederman D., Moran T.J., Schuller I.K. Phys. Rev. Lett. 76:1996;4624.
- (1996) Phys. Rev. Lett. , vol.76 , pp. 4624
- Nogués, J.¹ Lederman, D.² Moran, T.J.³ Schuller, I.K.⁴

8
- 0001507955
- Gökemeijer N.J., Cai J.W., Chien C.L. Phys. Rev. B. 60:1999;3033.
- (1999) Phys. Rev. B , vol.60 , pp. 3033
- Gökemeijer, N.J.¹ Cai, J.W.² Chien, C.L.³

9
- 18744422595
- Nolting F., Scholl A., Stöhr J., Seo J.W., Fompeyrine J., Siegwart H., Locquet J.-P., Anders S., Lüning J., Fullerton E.E., Toney M.F., Scheinfein M.R., Padmore H.A. Nature. 405:2000;767.
- (2000) Nature , vol.405 , pp. 767
- Nolting, F.¹ Scholl, A.² Stöhr, J.³ Seo, J.W.⁴ Fompeyrine, J.⁵ Siegwart, H.⁶ Locquet, J.-P.⁷ Anders, S.⁸ Lüning, J.⁹ Fullerton, E.E.¹⁰ Toney, M.F.¹¹ Scheinfein, M.R.¹² Padmore, H.A.¹³

10
- 0036696511
- Offi F., Kuch W., Kirschner J. Phys. Rev. B. 66:2002;064419.
- (2002) Phys. Rev. B , vol.66 , pp. 064419
- Offi, F.¹ Kuch, W.² Kirschner, J.³

11
- 0034274042
- Kuch W., Gilles J., Offi F., Kang S.S., Imada S., Suga S., Kirschner J. J. Electron Spectrosc. Relat. Phenom. 109:2000;249.
- (2000) J. Electron Spectrosc. Relat. Phenom. , vol.109 , pp. 249
- Kuch, W.¹ Gilles, J.² Offi, F.³ Kang, S.S.⁴ Imada, S.⁵ Suga, S.⁶ Kirschner, J.⁷

12
- 84988770724
- Kuch W., Offi F., Chelaru L.I., Kotsugi M., Fukumoto K., Kirschner J. Phys. Rev. B. 65:2002;140408.
- (2002) Phys. Rev. B , vol.65 , pp. 140408
- Kuch, W.¹ Offi, F.² Chelaru, L.I.³ Kotsugi, M.⁴ Fukumoto, K.⁵ Kirschner, J.⁶

13
- 0025543966
- Schneider C.M., Bressler P., Schuster P., Kirschner J., de Miguel J.J., Miranda R., Ferrer S. Vacuum. 41:1990;503.
- (1990) Vacuum , vol.41 , pp. 503
- Schneider, C.M.¹ Bressler, P.² Schuster, P.³ Kirschner, J.⁴ De Miguel, J.J.⁵ Miranda, R.⁶ Ferrer, S.⁷

14
- 11944250937
- Krams P., Lauks F., Stamps R.L., Hillebrands B., Güntherodt G. Phys. Rev. Lett. 69:1992;3674.
- (1992) Phys. Rev. Lett. , vol.69 , pp. 3674
- Krams, P.¹ Lauks, F.² Stamps, R.L.³ Hillebrands, B.⁴ Güntherodt, G.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.