Numerical analysis for systems with memory arising from semiconductor simulations

Applied Mathematics and Computation

Volumn 105, Issue 2-3, 1999, Pages 101-119

  Allegretto, W ^a   Lin, Y ^a   Zhou, A ^b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b INSTITUTE OF SYSTEMS SCIENCE   (China)

Author keywords

Amorphous silicon; Drift diffusion; Error estimates; Finite element

Indexed keywords

EID: 0141470839     PISSN: 00963003     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0096-3003(98)10081-4     Document Type: Article

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