Quality Control of Chalcopyrite Semiconductors by Raman Spectroscopic Techniques

Proceedings of the International Symposium on Test and Measurement

Volumn 5, Issue , 2003, Pages 3514-3516

  Xue, C ^a   Papadimitriou, D ^a   Esser, N ^b  

^a NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Anharmonic effects; CuGaSe2 MOCVD layers; Raman scattering; Structural properties

Indexed keywords

PHONON FREQUENCY SHIFTS;

DEFECTS; ENERGY GAP; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHONONS; PUMPING (LASER); QUALITY CONTROL; RAMAN SCATTERING; RAMAN SPECTROSCOPY;

SEMICONDUCTOR GROWTH;

EID: 0141453585     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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