Mitigation of pattern-induced degradation in SOA-based all-optical OTDM demultiplexers by using RZ-DPSK modulation format

IEEE Photonics Technology Letters

Volumn 15, Issue 9, 2003, Pages 1264-1266

  Chan, Kit ^a   Chan, Chun Kit ^a   Chen, Lian Kuan ^a   Tong, Frank ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

All optical demultiplexing; Optical time division multiplexing (OTDM); Pattern effect; Return to zero differential phase shift keying (RZ DPSK)

Indexed keywords

COMMUNICATION CHANNELS (INFORMATION THEORY); FIBER LASERS; INTERFEROMETERS; OPTICAL SWITCHES; PHASE SHIFT KEYING; TIME DIVISION MULTIPLEXING;

ELECTROABSORPTION MODULATOR; OPTICAL SIGNAL-TO-NOISE RATIO; OPTICAL TIME-DIVISION-MULTIPLEXING; PATTERN-INDUCED DEGRADATION; RETURN-TO-ZERO DIFFERENTIAL PHASE-SHIFTED-KEYING;

DEMULTIPLEXING;

EID: 0141451881     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2003.816701     Document Type: Article

References (7)

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