|
Volumn 482-485, Issue PART 2, 2001, Pages 1431-1439
|
A re-interpretation of the Cu{100}/Sn surface phase diagram
|
Author keywords
Computer simulations; Copper; Low energy electron diffraction (LEED); Low index single crystal surfaces; Metallic films; Surface relaxation and reconstruction; Tin
|
Indexed keywords
|
EID: 0141438482
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(01)00912-8 Document Type: Article |
Times cited : (27)
|
References (21)
|