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Volumn , Issue , 2003, Pages 15-16
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A 0.18μm Logic-based MRAM Technology for High Performance Nonvolatile Memory Applications
a a a a a a a a a a a a a a a a a a a a more.. |
Author keywords
Endurance; FET; Integration; MRAM; Yield
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Indexed keywords
ANTIFERROMAGNETIC MATERIALS;
CMOS INTEGRATED CIRCUITS;
COMPUTER SIMULATION;
FIELD EFFECT TRANSISTORS;
MAGNETORESISTANCE;
MICROPROCESSOR CHIPS;
TUNNEL JUNCTIONS;
COMPUTER CIRCUITS;
MAGNETIC RECORDING;
MRAM DEVICES;
OPTIMIZATION;
MAGNETORESISTIVE RANDOM ACCESS MEMORY (MRAM);
RANDOM ACCESS STORAGE;
DISTRIBUTION FUNCTIONS;
3 LEVELS;
CU METALLIZATION;
JUNCTION CELLS;
MAGNETIC TUNNEL JUNCTION;
MEMORY TECHNOLOGY;
NON-VOLATILE-MEMORY APPLICATIONS;
PERFORMANCE;
TEST CHIPS;
YIELD;
YIELD ANALYSIS;
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EID: 0141426849
PISSN: 07431562
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (17)
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References (4)
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