Surface morphology dependence of plasmon inelastic scattering in RHEED

Surface Science

Volumn 399, Issue 2-3, 1998, Pages 234-238

  Braun, Wolfgang ^b   Daweritz, Lutz ^a   Ploog, Klaus H ^c  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

^b ARIZONA STATE UNIVERSITY   (United States)

^c NONE

Author keywords

Electron energy loss spectroscopy; Electron solid interactions; Electron solid scattering and transmission inelastic; Gallium arsenide; Low index single crystal surfaces; Molecular beam epitaxy; Reflection high energy electron diffraction (RHEED); Se

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; MOLECULAR BEAM EPITAXY; MORPHOLOGY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SINGLE CRYSTALS; SURFACE STRUCTURE;

ALUMINUM ARSENIDE; PLASMON INELASTIC SCATTERING;

ELECTRON SCATTERING;

EID: 0043286537     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00822-4     Document Type: Article

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