Comment on "Intrinsic electron transport properties of carbon nanotube Y- junctions" [Appl. Phys. Lett. 81, 5234 (2002)]

Applied Physics Letters

Volumn 83, Issue 8, 2003, Pages 1674-1677

  Andriotis, Antonis N ^a   Srivastava, Deepak ^b   Menon, Madhu ^c   Meunier, Vincent ^d   Nardelli, Marco Buongiorno ^d   Bernholc, J ^e   Zacharia, Thomas ^d   Charlier, Jean Christophe ^f  

^a INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^b NASA AMES RESEARCH CENTER   (United States)

^c UNIVERSITY OF KENTUCKY   (United States)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

^e NORTH CAROLINA STATE UNIVERSITY   (United States)

^f UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

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Indexed keywords

EID: 0043283896     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1604948     Document Type: Letter

References (0)