Detecting work-function differences in scanning tunneling microscopy

Applied Physics Letters

Volumn 74, Issue 20, 1999, Pages 2963-2965

  Muller A D ^a   Muller F ^a   Hietschold, M ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043281145     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123980     Document Type: Article

References (11)

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