Optical surface analyzer inspects transparent wafers

Laser Focus World

Volumn 39, Issue 7, 2003, Pages 105-108

  Meeks, Steven W ^a  

^a Candela Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC SURFACE WAVE DEVICES; ELLIPSOMETRY; LIGHT REFLECTION; REFLECTOMETERS; SEMICONDUCTOR LASERS;

OPTICAL SURFACE ANALYZER;

LIGHT EMITTING DIODES;

EID: 0043269287     PISSN: 10438092     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (1)

1. www.marubeni-sunnyvale.com/gallium-nitride-wafers.html