-
1
-
-
0004201910
-
-
Biosym Technologies Inc., San Diego, CA, USA
-
Biosym Technologies (1993). InsightII. Biosym Technologies Inc., San Diego, CA, USA.
-
(1993)
InsightII
-
-
-
2
-
-
0008728242
-
-
Chakrabarthy, M. R., Ellis, R. L. & Roberts, J. L. (1970). J. Org. Chem. 35, 541-544.
-
(1970)
J. Org. Chem.
, vol.35
, pp. 541-544
-
-
Chakrabarthy, M.R.1
Ellis, R.L.2
Roberts, J.L.3
-
3
-
-
37049091598
-
-
Cox, P. J., McCabe, P. H., Milne, N. J. & Sim, G. A. (1985). J. Chem. Soc. Chem. Commun. pp. 626-628.
-
(1985)
J. Chem. Soc. Chem. Commun.
, pp. 626-628
-
-
Cox, P.J.1
McCabe, P.H.2
Milne, N.J.3
Sim, G.A.4
-
7
-
-
84985275148
-
-
Jeyaraman, R., Jawaharsingh, C. B., Avila, S., Ganapathy, K., Eliel, E. L., Manoharan, M. & Natschke, S. M. (1982). J. Heterocycl. Chem. 19, 449-451.
-
(1982)
J. Heterocycl. Chem.
, vol.19
, pp. 449-451
-
-
Jeyaraman, R.1
Jawaharsingh, C.B.2
Avila, S.3
Ganapathy, K.4
Eliel, E.L.5
Manoharan, M.6
Natschke, S.M.7
-
10
-
-
0014847763
-
-
Kobayashi, S., Hasegawa, S., Oshima, T. & Takagi, T. (1970). Toxicol. Appl. Pharmacol. 17, 344-348.
-
(1970)
Toxicol. Appl. Pharmacol.
, vol.17
, pp. 344-348
-
-
Kobayashi, S.1
Hasegawa, S.2
Oshima, T.3
Takagi, T.4
-
13
-
-
84906441301
-
-
Nardelli, M. (1983b). Acta Cryst. C39, 1141-1142.
-
(1983)
Acta Cryst.
, vol.C39
, pp. 1141-1142
-
-
Nardelli, M.1
-
15
-
-
0014867973
-
-
Ohki, E., Oida, S., Ohashi, Y., Takagi, H. & Iwai, I. (1970). Chem. Pharm. Bull. 18, 2050-2053.
-
(1970)
Chem. Pharm. Bull.
, vol.18
, pp. 2050-2053
-
-
Ohki, E.1
Oida, S.2
Ohashi, Y.3
Takagi, H.4
Iwai, I.5
-
16
-
-
84977285037
-
-
Priya, V., Shamala, N. & Viswamitra, M. A. (1993). Acta Cryst. 49, 983-985.
-
(1993)
Acta Cryst.
, vol.49
, pp. 983-985
-
-
Priya, V.1
Shamala, N.2
Viswamitra, M.A.3
-
17
-
-
4243494331
-
-
British Patent 833 65
-
Rossi, S. (1960). British Patent 833 65; Chem. Abstr. 54, 18551h.
-
(1960)
Chem. Abstr.
, vol.54
-
-
Rossi, S.1
-
20
-
-
0012892484
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Siemens (1994). P3/P4 Diffractometer Program. Version 4.27. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1994)
P3/P4 Diffractometer Program. Version 4.27
-
-
Siemens1
-
21
-
-
0015189421
-
-
Takeuchi, S., Fukano, T. Doshi, C. & Inoue, Y. (1971). J. Pharmacol. 21, 811-814.
-
(1971)
J. Pharmacol.
, vol.21
, pp. 811-814
-
-
Takeuchi, S.1
Fukano, T.2
Doshi, C.3
Inoue, Y.4
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